ISO 26262-11: Multi-Point Fault and Latent Fault Handling in Silicon

Date
2027-02-08
Location
Online
Host
Zach L

About this event

A live 30-minute expert session on Multi-Point Fault and Latent Fault Handling in Silicon (ISO 26262-11 — Semiconductor Functional Safety). What We'll Cover: What latent and multi-point faults are and where their analysis sits in the semiconductor safety concept Step-by-step: identify mechanism-of-the-mechanism gaps, define LBIST/MBIST and software test coverage, set multi-point fault detection intervals How latent fault handling maps to LFM targets and the test specification artifacts produced Common mistakes: assuming key-on tests cover all latents, unbounded detection intervals, no failure reaction after latent detection The latent fault list, interval justification and test coverage evidence auditors review Related topics: latent faults · multiple point faults · lfm · lbist · mbist · k

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About Functional Safety Foundations

This online session delivers expert-led instruction on the regulatory landscape and implementation approach for Functional Safety Foundations.

The cross-sector fundamentals underlying every functional safety standard: risk as severity × likelihood, the safety function concept, integrity levels, the safety lifecycle, and the split between random and systematic failures.

What it regulates

Shared vocabulary and reasoning: hazard → risk → risk reduction allocation → safety requirement → verified implementation → maintained integrity in operation.

Who must comply

Everyone entering the field — the conceptual base of the entire catalog.

Key requirements of Functional Safety Foundations

  • Hazard and risk fundamentals
  • Safety function anatomy: sensor-logic-actuator with defined safe state
  • Integrity ladders (SIL/PL/ASIL/DAL) as risk-reduction currencies
  • Random vs systematic failure treatment
  • Lifecycle and management of functional safety incl. competence

Key concepts: Functional Safety Foundations

Safe state
The defined condition a function drives the equipment to on demand or fault.
Functional safety management
Planning, competence, documentation and assessment wrapped around technical work.
Random vs systematic
Hardware wear-out/chance failures quantified statistically versus design/process errors controlled by rigor.
Risk reduction allocation
Distributing required risk reduction among mechanical design, safeguards, control functions and procedures.

Frequently asked questions: Functional Safety Foundations

Why can't testing alone prove safety?

Rare-event targets (like 1e-7/h) are unverifiable by test duration, and systematic errors evade random testing — hence the standards' dual machinery of quantified hardware analysis plus process rigor and independent assessment.

Standard information based on the published text of Functional Safety Foundations. Event content is provided by the host. For authoritative guidance, consult the official standard body.